JPH0362010B2 - - Google Patents
Info
- Publication number
- JPH0362010B2 JPH0362010B2 JP3533284A JP3533284A JPH0362010B2 JP H0362010 B2 JPH0362010 B2 JP H0362010B2 JP 3533284 A JP3533284 A JP 3533284A JP 3533284 A JP3533284 A JP 3533284A JP H0362010 B2 JPH0362010 B2 JP H0362010B2
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- pattern
- area
- alignment marks
- alignment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
- G03F9/7073—Alignment marks and their environment
- G03F9/7076—Mark details, e.g. phase grating mark, temporary mark
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59035332A JPS60180120A (ja) | 1984-02-28 | 1984-02-28 | アライメント方法 |
US07/186,773 US4883359A (en) | 1984-02-28 | 1988-04-25 | Alignment method and pattern forming method using the same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59035332A JPS60180120A (ja) | 1984-02-28 | 1984-02-28 | アライメント方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60180120A JPS60180120A (ja) | 1985-09-13 |
JPH0362010B2 true JPH0362010B2 (en]) | 1991-09-24 |
Family
ID=12438874
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP59035332A Granted JPS60180120A (ja) | 1984-02-28 | 1984-02-28 | アライメント方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60180120A (en]) |
-
1984
- 1984-02-28 JP JP59035332A patent/JPS60180120A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS60180120A (ja) | 1985-09-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
EXPY | Cancellation because of completion of term |